Meet the SP203P: A Cost-Effective Solution for SWIR Emission Measurement

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Yoni Groisman

Application Engineer

In the ever-evolving landscape of photonics, the demand for efficient and reliable measurement solutions continues to soar. Ophir is proud to introduce its latest innovation: the SP203P phosphor-coated Beam Profiling camera. Designed to address the burgeoning need for cost-effective SWIR (shortwave infrared) emission measurement, the SP203P promises to revolutionize industries ranging from industrial Machine Vision to Telecommunications and beyond.

Meeting the Demand for SWIR Emitters: Applications and Challenges

SWIR emitters, particularly those emitting at 1550nm, play a pivotal role across diverse fields. From industrial Machine Vision applications such as inspection, sorting, and quality control to Telecommunications and Remote Sensing, the versatility of SWIR technology knows no bounds. Its low absorbance in optical fibers makes it ideal for long-distance communication, while its ability to penetrate haze coupled with higher resolution and stronger contrast renders it indispensable in LIDAR systems for autonomous vehicles.

The Need for Regular Measurement and Evaluation

However, the widespread deployment of SWIR emitters presents its own set of challenges. These devices, often deployed in industrial field conditions and integrated into various apparatus, require regular measurement of emitter beam quality, uniformity, and power distribution. Failure to promptly detect emitter degradation caused by internal factors or contamination can significantly impact sensor readings, leading to inaccurate results and potentially costly repercussions.

Introducing the SP203P: A Practical Solution for Field Technicians

Traditionally, SWIR cameras based on InGaAs sensors have been the go-to solution for SWIR emission measurement. However, their high cost and susceptibility to government regulations make them impractical for field technicians. Recognizing this gap in the market, Ophir MKS introduces the SP203P beam profiler camera.

How Does it Work?

The SP203P utilizes a standard CMOS sensor coated with phosphor. SWIR light is absorbed by the phosphor coating and subsequently emitted in the visible range toward the CMOS sensor. While not as accurate as SWIR cameras, the SP203P offers a practical and cost-effective solution for evaluating SWIR emitters in field conditions.

BeamGage image of Beam Profile of 1550nm laser

Conclusion: Empowering Technicians with Practical Solutions

In conclusion, the SP203P from Ophir MKS represents a significant leap forward in the realm of SWIR emission measurement. By offering a practical alternative to expensive SWIR cameras, the SP203P empowers field technicians to effectively evaluate SWIR emitters in real-world conditions, ensuring optimal performance and reliability across a diverse array of applications. With its innovative design and cost-effective approach, the SP203P is poised to become an indispensable tool for industries at the forefront of photonics innovation.

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Yoni Groisman

Application Engineer

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