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Blog post
Ophir New Large Beam Profiler with Small Pixel Size for Higher Resolution Measurement of Large and Divergent Beams
Sep 21, 2022
Blog post
Meet the Team: Shai Luria, Senior Quality Assurance Manager, Shares the Most Satisfying Aspect of His Job and Why He Decided to Come Back to Ophir After 20 Years
Sep 14, 2022
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On-demand Webinar: High Power laser measurement challenges and solutions
Aug 31, 2022
Blog post
And the Winner is – BeamPeek™ Beam Profiler !!
Aug 24, 2022
Blog post
Damage Threshold – When the Datasheet and the Sensor Finder Disagree
Aug 10, 2022
Blog post
Integrating Power Measurements Into Your Software Application With the Ophir Com Object
Aug 3, 2022
Blog post
Ariel All-in-One High Power Sensor is the Best Solution Available for Measuring Laser in Industrial Applications – Here’s Why
Jul 27, 2022
Blog post
WB-I VIS: Wide Beam Imager for 350-1100nm wavelengths -Now operates with Ophir’s new, high resolution camera SP932U
Jul 20, 2022
Blog post
Watch: On-demand Webinar – Laser Measurement Solutions for Material Micro Processing Applications
Jun 29, 2022
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